Enhancement Mode GaN on Silicon (eGaN® FETs) for Coil Detuning
نویسندگان
چکیده
Fig 2: Schematic of test coil with interchangeable detuning circuits. Pickup loops P1 and P2 are used to quantify detuning. 4879 Enhancement Mode GaN on Silicon (eGaN® FETs) for Coil Detuning Michael Twieg, Matthew J Riffe, Michael de Rooij, and Mark A Griswold Dept. of Electrical Engineering and Computer Science, Case Western Reserve University, Cleveland, OH, United States, Dept. of Biomedical Engineering, Case Western Reserve University, Cleveland, OH, United States, Efficient Power Conversion Corporation, El Segundo, CA, United States, Dept. of Radiology, Case Western Reserve University, Cleveland, OH, United States
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